Mechanical Stress Effects on Electromigration Voiding in a...

MRS Proceedings 1993 / 1 Vol. 308

Mechanical Stress Effects on Electromigration Voiding in a Meandering Test Stripe

Lowry, Lynn E., Tai, Beverly H., Mattila, J., Walsh, LH.
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Volume:
308
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-308-273
Date:
January, 1993
File:
PDF, 1.12 MB
english, 1993
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