Growth Morphology of InN Thin Films by Scanning Tunneling...

MRS Proceedings 1993 / 1 Vol. 312

Growth Morphology of InN Thin Films by Scanning Tunneling and Atomic Force Microscopies and X-Ray Scattering

Bryden, Wayne A., Hawley, Marilyn E., Ecelberger, Scott A., Kistenmacher, Thomas J.
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Volume:
312
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-312-95
Date:
January, 1993
File:
PDF, 1.06 MB
english, 1993
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