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Observation and Measurement of Atomic Scale Imperfections in Materials Using CBED+EBI/H
Herring, Rodney A., Bonevich, John E., Tanji, Takayoshi, Tonomura, AkiraVolume:
332
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-332-231
Date:
January, 1994
File:
PDF, 4.19 MB
english, 1994