Defect Distribution and Bonding Structure in High Band Gap...

MRS Proceedings 1994 / 1 Vol. 336

Defect Distribution and Bonding Structure in High Band Gap a-Si1−xCx:H Films Deposited in H2 Dilution

Galloni, R., Rizzoli, R., Summonte, C., Demichelis, F., Giorgis, F., Pirri, C. F., Tresso, E., Ambrosone, G., Catalanotti, C., Coscia, U., Rava, P., Della Mea, G., Rigato, V., Madan, A., Zignani, F.
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Volume:
336
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-336-517
Date:
January, 1994
File:
PDF, 330 KB
english, 1994
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