Atomic Force Microscopy Structural Characterization of...

MRS Proceedings 1994 / 1 Vol. 338

Atomic Force Microscopy Structural Characterization of Polyaniline Thin Film Sensors

Josefowicz, Jack Y., Yamagishi, Frederick G., Ast, Camille I. van
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Volume:
338
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-338-605
Date:
January, 1994
File:
PDF, 2.56 MB
english, 1994
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