Open-Ended Coaxial Probes for Nondestructive Testing of...

Open-Ended Coaxial Probes for Nondestructive Testing of Substrates and Circuit Boards

Baker-Jarvis, James, Janezic, Michael D.
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Volume:
347
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-347-215
Date:
January, 1994
File:
PDF, 293 KB
english, 1994
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