Open-Ended Coaxial Probes for Nondestructive Testing of Substrates and Circuit Boards
Baker-Jarvis, James, Janezic, Michael D.Volume:
347
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-347-215
Date:
January, 1994
File:
PDF, 293 KB
english, 1994