Crystalline Perfection of Semiconductor Surfaces by X-Ray...

MRS Proceedings 1994 / 1 Vol. 355

Crystalline Perfection of Semiconductor Surfaces by X-Ray Multiple Diffraction

Morelhao, S. L., Avanci, L. H., Cardoso, L. P.
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Volume:
355
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-355-215
Date:
January, 1994
File:
PDF, 462 KB
english, 1994
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