![](/img/cover-not-exists.png)
Influence of Interface Roughness Scattering on Electron Mobility in GaAs-Al0.3Ga0.7 as Two Dimensional Electron Gas (2DEG) Heterostructures
Yang, Bin, Cheng, Yong-Hai, Wang, Zhan-Guo, Liang, Ji-Ben, Liao, Qi-Wei, Lin, Lan-Ying, Zhu, Zhan-Ping, Xu, Bo, Li, WeiVolume:
355
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-355-545
Date:
January, 1994
File:
PDF, 378 KB
english, 1994