![](/img/cover-not-exists.png)
Effects of A.C. Stress on Charge and Voltage Decay Rates of PZT Thin Film Capacitors for DRAM Applications
Khamankar, Rajesh B., Kim, Jiyoung, Jiang, Bo, Lee, JackVolume:
361
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-361-263
Date:
January, 1994
File:
PDF, 376 KB
english, 1994