Morphological Evolution with Layer Thickness in single...

Morphological Evolution with Layer Thickness in single crystal CeO2(110)/Si(100)

Inoue, Tomoyasu, Yamamoto, Yasuhiro, Satoh, Masataka, Ohsuna, Tetsu
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Volume:
367
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-367-323
Date:
January, 1994
File:
PDF, 2.12 MB
english, 1994
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