Resolving Degradation Mechanism in Carbon and Beryllium...

Resolving Degradation Mechanism in Carbon and Beryllium Doped HBT’s Using Pulsed Mode Current Stress

Chou, Y. C., Li, G.P., Wu, C.S., Chu, Peter, Pao, C.K., Cisco, T.C.
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Volume:
378
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-378-777
Date:
January, 1995
File:
PDF, 319 KB
english, 1995
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