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Resolving Degradation Mechanism in Carbon and Beryllium Doped HBT’s Using Pulsed Mode Current Stress
Chou, Y. C., Li, G.P., Wu, C.S., Chu, Peter, Pao, C.K., Cisco, T.C.Volume:
378
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-378-777
Date:
January, 1995
File:
PDF, 319 KB
english, 1995