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High-Resolution Transmission Electron Microscopy Study of Metallic Spin-Glass/Amorphous Silicon Multilayers
Howell, David A., Crimp, Martin A., Hoines, Lilian M., Bass, J.Volume:
382
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-382-185
Date:
January, 1995
File:
PDF, 3.16 MB
english, 1995