Deposition of Ca+, Na+, Al+, K+ on Single-Crystal Si From DIH20: NH40H: H202 and DIH20: HCL: H202 as Analyzed by ToF-SIMS and SPV
Debusk, Damon, Lowell, John, Reich, FraserVolume:
386
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-386-151
Date:
January, 1995
File:
PDF, 1.16 MB
english, 1995