Reliability Issues with Mixed-Signal CMOS Technology

MRS Proceedings 1995 / 1 Vol. 391

Reliability Issues with Mixed-Signal CMOS Technology

Lahri, Rajeeva, Chen, Hung-Sheng, Zhao, Ji, Gadepally, Kamesh, Teng, C.S.
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Volume:
391
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-391-47
Date:
January, 1995
File:
PDF, 1.18 MB
english, 1995
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