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Analysis of Reflection High Energy Electron Diffraction Pattern of Silicon Carbide Grown on Silicon
Teichert, G., Pezoldt, J., Cimalla, V., Nennewitz, O., Spiess, L.Volume:
399
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-399-17
Date:
January, 1995
File:
PDF, 3.05 MB
english, 1995