Fast Scanned Energy Beam Induced Explosive Crystallization...

Fast Scanned Energy Beam Induced Explosive Crystallization of Ion Implantation Amorphized Poly and Single Crystal Silicon Substrates

Lerme, M., Ternisien D'ouville, T., Vu, Duy-Phach, Perio, A., Rozgonyi, G.A., Nguyen, V. T.
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Volume:
4
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-4-547
Date:
January, 1981
File:
PDF, 1.31 MB
english, 1981
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