Atomic Force Microscopy Study of GaN-Buffer Layers on...

MRS Proceedings 1996 / 1 Vol. 423

Atomic Force Microscopy Study of GaN-Buffer Layers on SiC(0001) By MOCVD

Lim, Dongsup, Byun, Dongjin, Kim, Gyeungho, Nam, Ok-Hyun, Choi, In-Hoon, Park, Dalkeun, Kum, Dong-Wha

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Volume:

423

Language:

english

Journal:

MRS Proceedings

DOI:

10.1557/proc-423-451

Date:

January, 1996

File:

PDF, 1.74 MB

english, 1996

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