Current Dependence of Reversible Electromigration Induced...

MRS Proceedings 1996 / 1 Vol. 428

Current Dependence of Reversible Electromigration Induced Resistance Changes in Short Al Lines and Interpretation of Irreversible Effects

Verbruggen, A. H., Van Den Homberg, M. J. C., Kalkman, A. J., Kraayeveld, J. R., Willemsen, A. W.-J., Radelaar, S.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
428
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-428-121
Date:
January, 1996
File:
PDF, 823 KB
english, 1996
Conversion to is in progress
Conversion to is failed