Modeling of Extended Defects in Silicon

MRS Proceedings 1996 / 1 Vol. 438

Modeling of Extended Defects in Silicon

Law, M. E., Jones, K. S., Earles, S. K., Lilak, A. D., Xu, J-W.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
438
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-438-45
Date:
January, 1996
File:
PDF, 392 KB
english, 1996
Conversion to is in progress
Conversion to is failed