A Quantum Mechanical Investigation of Positively Charged...

MRS Proceedings 1996 / 1 Vol. 446

A Quantum Mechanical Investigation of Positively Charged Defects In SiO2 Thin Film Devices

Ferreira, Antonio M., Kama, Shashi P., Brothers, Charles P., Pugh, Robert D., Singaraju, Babu B. K., Vanheusden, Karel, Warren, William L., Devine, Roderick A. B.
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Volume:
446
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-446-247
Date:
January, 1996
File:
PDF, 346 KB
english, 1996
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