Comparison of Gate Oxide Processing Techniques for Thin...

Comparison of Gate Oxide Processing Techniques for Thin Dielectric Films

Schay, Pat, Lin, Fuyu, Ajuria, Sergio, Stih, John
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Volume:
446
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-446-41
Date:
January, 1996
File:
PDF, 736 KB
english, 1996
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