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Monitoring of indium x-ray peak to optimize InxGa1-xN layer grown by metalorganic chemical vapor deposition
Lu, Hongqiang, Thothathiri, Malathi, Wu, Ziming, Bhat, IshwaraVolume:
449
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-449-1005
Date:
January, 1996
File:
PDF, 1.53 MB
english, 1996