Variation of GaN Valence Bands with Biaxial Stress:...

MRS Proceedings 1996 / 1 Vol. 449

Variation of GaN Valence Bands with Biaxial Stress: Quantification of Residual Stress and Impact on Fundamental Band Parameters

Edwards, N. V., Yoo, S. D., Bremser, M. D., Horton, M. N., Perkins, N. R., Weeks, T. W., Liu, H., Stall, R. A., Kuech, T. F., Davis, R. F., Aspnes, D. E.
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Volume:
449
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-449-781
Date:
January, 1996
File:
PDF, 393 KB
english, 1996
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