Depth Gradients in Porous Silicon: How to Measure Them and How to Avoid Them
Thönissen, M., Berger, M. G., Theiβ, W., Hilbrich, S., Krüger, M., Arens-Fischer, R., Billat, S., Lerondel, G., Lüth, H.Volume:
452
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-452-431
Date:
January, 1996
File:
PDF, 349 KB
english, 1996