Processing, X-Ray, and TEM Studies of QS87 Series 56...

MRS Proceedings 1996 / 1 Vol. 457

Processing, X-Ray, and TEM Studies of QS87 Series 56 KΩ/Square Thick Film Resistors

Crosbie, Gary M., Johnson, Frank, Donlon, William T.
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Volume:
457
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-457-381
Date:
January, 1996
File:
PDF, 1.25 MB
english, 1996
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