Characterization of Nanosized Silicon Prepared by...

Characterization of Nanosized Silicon Prepared by Mechanical Attrition for High Refractive Index Nanocomposites

Bhagwagar, Dorab E., Wisnfficki, Peter, Papadimtrakopoulos, Fotios
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Volume:
457
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-457-439
Date:
January, 1996
File:
PDF, 360 KB
english, 1996
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