EBIC Spectroscopy - A New Approach to Microscale...

MRS Proceedings 1985 / 1 Vol. 46

EBIC Spectroscopy - A New Approach to Microscale Characterization of Deep Levels in Semi-Insulating GaAs

Li, C.-J., Sun, Q., Lagowski, J., Gatos, H.C.
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Volume:
46
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-46-441
Date:
January, 1985
File:
PDF, 375 KB
english, 1985
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