Internal Electric Field Profile in Thin Film Hydrogenated...

MRS Proceedings 1997 / 1 Vol. 467

Internal Electric Field Profile in Thin Film Hydrogenated Amorphous Silicon Diodes Studied by the Transient-Null-Current Method

Han, Daxing, Yeh, Chenan, Wang, Keda, Qiwang,
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Volume:
467
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-467-729
Date:
January, 1997
File:
PDF, 313 KB
english, 1997
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