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Stress in Ag/Ni Multilayers: A Comparison of Specimen-Curvature and X-Ray Diffraction Methods
Gergaud, P., Labat, S., Yang, H., Bottger, A., SandstrÖm, P., Svedberg, Erik, Mittemeijer, E.J., Sundgren, J.E., Thomas, O.Volume:
472
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-472-299
Date:
January, 1997
File:
PDF, 458 KB
english, 1997