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Progress and Prospects of Materials Characterization at Subnanometer Spatial Resolution using Finely Focussed Electron Beams
Isaacson, MichaelVolume:
48
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-48-107
Date:
January, 1985
File:
PDF, 790 KB
english, 1985