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Influence of Structural Defects and Zinc Composition Variation on the Device Response of Cd1−xZnxTe Radiation Detectors
Yoon, H., Scyoc, J. M. Van, Gilbert, T. S., Goorsky, M. S., Brunett, B. A., Lundt, J. C., Hermon, H., Schieber, M., James, R. B.Volume:
484
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-484-241
Date:
January, 1997
File:
PDF, 1.68 MB
english, 1997