Characterization of Erbium Doped SiO2 Layers Formed On...

Characterization of Erbium Doped SiO2 Layers Formed On Silicon By Spark Processing

John, John V. St., Coffer, Jeffery L., Rho, Young Gyu, Diehl, Patrick, Pinizzotto, Russell F., Culp, Thomas D., Bray, Kevin L.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
486
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-486-281
Date:
January, 1997
File:
PDF, 1.03 MB
english, 1997
Conversion to is in progress
Conversion to is failed