Influence Of Structural Defects And Zinc Composition Variation On The Device Response Of Cdl-xZnxTe Radiation Detectors
Yoon, H., Scyoc, J. M. Van, Gilbert, T. S., Goorsky, M. S., Brunett, B. A., Lund, J. C., Hermon, H., Schiebert, M., James, R. B.Volume:
487
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-487-115
Date:
January, 1997
File:
PDF, 1.65 MB
english, 1997