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Photo-Leakage-Current Analysis of Poly-Si TFT by Using Rear Irradiation OBIC Method
Wakagi, Masatoshi, Ookubo, Tatsuya, Ando, Masahiko, Kawachi, Genshiro, Mimura, Akio, Minemura, TetsurohVolume:
507
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-507-55
Date:
January, 1998
File:
PDF, 2.19 MB
english, 1998