Electron and Hole Transient Currents in Hydrogenated Amorphous Silicon and Some Alloys Measured by The Photoconductive Time-of-Flight Technique
Eliat, Astrid, Adriaenssens, Guy, Yan, BaojieVolume:
507
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-507-661
Date:
January, 1998
File:
PDF, 316 KB
english, 1998