Odmr Measurements of Microcrystalline Silicon

Odmr Measurements of Microcrystalline Silicon

Malten, C., Carius, R., Finger, F., Yamasaki, S.
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Volume:
507
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-507-787
Date:
January, 1998
File:
PDF, 395 KB
english, 1998
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