The Engineering of Silicon Wafer Material Properties...

The Engineering of Silicon Wafer Material Properties Through Vacancy Concentration Profile Control and the Achievement of Ideal Oxygen Precipitation Behavior

Falster, R., Gambaro, D., Olmo, M., Cornara, M., Korb, H.
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Volume:
510
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-510-27
Date:
January, 1998
File:
PDF, 3.10 MB
english, 1998
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