![](/img/cover-not-exists.png)
Experimental Investigation on Interfacial Adhesion in Microelectronic Assemblies
Dai, Xiang, Brillhart, Mark V., Ho, Paul S.Volume:
515
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-515-15
Date:
January, 1998
File:
PDF, 2.53 MB
english, 1998