Investigations of Electromigration Failure by Electrical...

Investigations of Electromigration Failure by Electrical Measurement and Scanning Probe Microscopy With Additional Simulation

Fabricius, Alexander, Breternitz, Volkmar, Knedlik, Christian, Henning, Andreas, Liebscher, Eckhard, Vogel, Silvia
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Volume:
516
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-516-27
Date:
January, 1998
File:
PDF, 763 KB
english, 1998
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