Fundraising September 15, 2024 – October 1, 2024 About fundraising

Channel Cracking Technique for Toughness Measurement of...

Channel Cracking Technique for Toughness Measurement of Brittle Dielectric Thin Films on Silicon Substrates

Ma, Qing, Xie, Joseph, Chao, Sam, El-Mansy, Safaa, Mcfadden, Robert, Fujimoto, Harry
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
516
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-516-331
Date:
January, 1998
File:
PDF, 1.25 MB
english, 1998
Conversion to is in progress
Conversion to is failed