Near-Field Optical Imaging of Electromigration Damages in...

MRS Proceedings 1999 / 1 Vol. 571

Near-Field Optical Imaging of Electromigration Damages in Passivated Metal Stripes

Bonera, E., Borghesi, A., Caprile, C.
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Volume:
571
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-571-101
Date:
January, 1999
File:
PDF, 1.83 MB
english, 1999
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