Structure of InAs Quantum Dots in Si Matrix Investigated by High Resolution Electron Microscopy
Zakharov, N. D., Werner, P., Ustinov, V. M., Kovsh, A.R., Cirlin, G. E., Smolski, O.V., Denisov, D.V., Alferov, Zh. I., Ledentsov, N. N., Heitz, R., Bimberg, D.Volume:
571
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-571-299
Date:
January, 1999
File:
PDF, 1.98 MB
english, 1999