Structure of Chemically Passivated Semiconductor Surfaces Determined Using X-Ray Absorption Spectroscopy
Hitchcock, A. P., Tyliszczak, T., Lu, Z. H., Brodersen, P., Dharmawardana, M. W. C.Volume:
573
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-573-31
Date:
January, 1999
File:
PDF, 1.27 MB
english, 1999