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Transition Temperatures in Plastic Yielding and Fracture of Semiconductors
Pirouz, P., Kubin, L. P., Demenet, J. L., Hong, M. H., Samant, A. V.Volume:
578
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-578-205
Date:
January, 1999
File:
PDF, 1.58 MB
english, 1999