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Improved Algorithm to Extract Force-distance Curves from Scanning Force Microscope Data
Eppell, Steven J., Todd, Brian A., Zypman, Fredy R.Volume:
584
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-584-189
Date:
January, 1999
File:
PDF, 454 KB
english, 1999