Atomic-Scale Structure of the Si-SiO2 and SiC-SiO2...

MRS Proceedings 1999 / 1 Vol. 592

Atomic-Scale Structure of the Si-SiO2 and SiC-SiO2 Interfaces and the Origin of Their Contrasting Properties

Buczko, Ryszard, Pennycook, Stephen J., Pantelides, Sokrates T.
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Volume:
592
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-592-227
Date:
January, 1999
File:
PDF, 2.34 MB
english, 1999
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