Structural and Electronic Properties of Line Defects in GaN

MRS Proceedings 1999 / 1 Vol. 595

Structural and Electronic Properties of Line Defects in GaN

Elsner, Joachim, Blumenau, Alexander Th., Frauenheim, Thomas, Jones, Robert, Heggie, Malcolm I.
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
595
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-595-f99w9.3
Date:
January, 1999
File:
PDF, 248 KB
english, 1999
Conversion to is in progress
Conversion to is failed