High-Resolution X-ray Diffraction Analysis of p-Type...

MRS Proceedings 1999 / 1 Vol. 607

High-Resolution X-ray Diffraction Analysis of p-Type Strained InGaAs/AlGaAs Multiple Quantum Well Structures

Shi, W., Zhang, D. H., Osotchan, T., Zhang, P.H., Yoon, S. F., Swaminathan, S.
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Volume:
607
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-607-229
Date:
January, 1999
File:
PDF, 341 KB
english, 1999
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