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Memory effects in MOS capacitors with silicon rich oxide insulators
Lombardo, S., Crupi, I., Spinella, C., Bongiorno, C., Liao, Y., Gerardi, C., Vulpio, M., Fazio, B., Privitera, S.Volume:
609
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-609-a29.1
Date:
January, 2000
File:
PDF, 1.60 MB
english, 2000