Thickness and Interface Layer Effects on the Amorphous...

MRS Proceedings 2000 / 1 Vol. 609

Thickness and Interface Layer Effects on the Amorphous Silicon Film Property Studied by Various Photoluminescence Excitation Wavelengths

Yue, Guozhen, Han, Daxing, Yang, Jeffrey, Guha, Subhendu
How much do you like this book?
What’s the quality of the file?
Download the book for quality assessment
What’s the quality of the downloaded files?
Volume:
609
Language:
english
Journal:
MRS Proceedings
DOI:
10.1557/proc-609-a5.9
Date:
January, 2000
File:
PDF, 196 KB
english, 2000
Conversion to is in progress
Conversion to is failed